ORA design BUILT - IN SELF - TEST FOR I / O BUFFERS IN FPGAS
نویسندگان
چکیده
A Built-In Self-Test (BIST) approach for the programmable Input/Output (I/O) buffers in Field Programmable Gate Arrays (FPGAs) is presented. The I/O buffers are tested for their various modes of operation along with their associated routing sources. A general BIST architecture, applicable to any FPGA, is presented along with the features and limitations of the approach. Experimental results are given for BIST configurations developed to test the I/O buffers in Atmel AT40K series FPGAs and associated with the FPGA core of Atmel AT94K series System-on-Chip (SoC). 1
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.......................................................................................................................................... ii Acknowledgments.......................................................................................................................... iv List of Tables ......................................................................................................
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